X-Rite and Karl Suss America join to improve optical testing of VCSELs at wafer level
Aug. 31, 2001--X-Rite, Incorporated announced its electro-optics subsidiary, Labsphere, and Karl Suss America, Inc. have introduced a new turnkey VCSEL Wafer Prober System.
X-Rite, Incorporated (Nasdaq:XRIT) announced its electro-optics subsidiary, Labsphere, and Karl Suss America, Inc. have introduced a new turnkey VCSEL (vertical-cavity surface-emitting lasers) Wafer Prober System. The system is intended for high-speed wafer device characterization essential to the production of semiconductor and other advanced electronic packaging applications.
This system measures the optical and electrical performance of VCSELs on the wafer before they are separated into individual components. Since a semiconductor wafer can contain 100,000 die, measuring them before they are separated improves productivity and reduces cost as the components are packaged.
"Wafer level testing of VCSEL, Optical MEMS and LEDs moves device verification to the earliest possible step in the process saving manufacturers time and money by identifying performance criteria as early in the process as possible," said Rich Cook, CEO of X-Rite, Incorporated.
Karl Suss is a manufacturer and supplier of precision microelectronics equipment for the manufacturing and R&D environments. For more information, visit www.suss.com.
Labsphere, Inc., a wholly owned subsidiary of X-Rite, Incorporated, offers optical measurement solutions for the telecommunications, aerospace, lighting and analytical instrument markets. For more information, visit www.labsphere.com.
X-Rite, Incorporated produces precision measurement devices, systems, and processes that enhance the measurement of color, light and shape. For more information, visit www.x-rite.com.