September 1, 2005 Blacksburg, VA -- Luna Technologies has introduced its 1310-nm Optical Backscatter Reflectometer (OBR), a frequency-domain reflectometer and failure analysis tool that the company says offers unprecedented diagnostic capabilities to fiber-optic manufacturers. According to the company, using the OBR, designers and manufacturers can peer into the heart of optical components, modules, and assemblies to measure minute reflections with -125 dB sensitivity, 70 dB dynamic range, and down to 10 micrometer spatial resolution.
The company says the OBR's wavelength functionality will help component and system level designers eliminate the time and expense of component characterization and short-haul optical link integrity management for a range of applications covering the 1310-nm wavelength band, including passive optical networks for FTTx and active networks for avionics applications. The company says the device's wavelength capability also enables troubleshooting of fiber-optic modules for DWDM applications by "seeing through" optical elements such as isolators and erbium doped fiber that are opaque in the 1550-nm wavelength region. According to the company, further enhancements to the device extend its measurement range to over 300 m with sub-millimeter resolution providing additional functionality and flexibility to the system.
The device comes configured with an integrated internal tunable laser source, a computer, and a monitor.
"The OBR represents a shift in the way manufacturers produce and manage fiber-optic equipment," contends John Goehrke, CEO of Luna Technologies. "This addition to the OBR product line allows our customers to significantly reduce both their time and cost of test for a much broader range of modern optical networking components."