Technical application note

Jan 1st, 1996

Technical application note

Mask Testing on SDH: STM-1E and Sonet: STS-3 Electrical 155-Mbit/sec Signals application note discusses reasons for mask testing to verify compliance of a device with standards and code mark inversion encoding. The technical application note also refers to measurement accuracy for amplitude and rise time.

LeCroy

Chestnut Ridge, NJ

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