PCIe 6.0 TX/RX LEQ Compliance Test
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A certificate of attendance will be offered.
Summary
Learn how to confidently pass PCI compliance testing with proven, repeatable techniques. This webinar walks through stressed eye calibration best practices and provides a clear, practical overview of TX and RX LEQ testing using detailed block diagrams and real test procedures. You will also learn how to identify and troubleshoot common issues in TX and RX LEQ tests and jitter tolerance testing so you can resolve problems faster and avoid costly rework.
Attendees will gain insights on:
- Best practices for stressed eye calibration and PCI compliance readiness
- Practical TX and RX LEQ testing workflows using real measurement examples
- How to diagnose and troubleshoot common LEQ and jitter tolerance issues
Speaker
Hiroshi Goto
High Speed and Optical Engineer
Anritsu Company
Hiroshi Goto has over 35 years of experience as a high speed and optical Engineer at Anritsu Company holding a variety of positions, including Design Engineer, Product Marketing Engineer and currently high speed and optical Product Manager and Sr. Business Development Manager. Mr. Goto holds a Bachelor’s degree in Physics from Aoyama Gakuin University in Tokyo Japan. He resides in the Dallas area and has authored numerous industry application notes and white papers and frequently speaks on the topic of signal integrity.
Moderator
Sean Buckley
Editor in Chief
Lightwave
Sean is responsible for establishing and executing the editorial strategy of Lightwave across its website, email newsletters, events, and other information products.
