Anritsu offers signal generation/analysis up to 56 Gbps

SEPTEMBER 21, 2009 -- The company's MP1800A signal quality analyzer series measures BER of optical modulation devices and 10G/40G/100G optical/digital devices.

Pennwell web 300 214

SEPTEMBER 21, 2009 -- Anritsu Corp. has introduced the new 56-Gbps mux/demux modules to its MP1800 signal quality analyzer.

Pennwell web 300 214To overcome the price/performance issues that have slowed down 40G networks deployment since 2001, new standards use WDM transmission equipment and phase-modulation technologies to implement more robust and easier-to-maintain transmission, even with the next to come higher symbol rates.

With many equipment vendors focusing to meet these needs, the MP1821A 50G/56-Gbps mux and MP1822A 50G/56-Gbps demux are designed to help development teams assess quality of transmission and verify performance against complexity for the new components of next-generation networking.

Covering bit rates from 8 to 56 Gbps, the units have been developed to reduce the complexity and issues that engineers need to face when testing very high bit rates in the R&D laboratory.

The modules can be used for research on signal transmission and development of high-speed components, including direct evaluation of wafers on probe stations.

Applications include:

  • 40-Gbps long-haul transmission using phase modulation such as DQPSK
  • 112-Gbps long-haul transmission using modulation such as DQPSK and DP-QPSK

The modules provide:

  • evaluation of next-generation IFs supporting operation frequencies up to 56 Gbps
  • direct-drive EML using high-quality, high-amplitude waveforms up to 3.5 Vp-p
  • testing DQPSK modulators, using I and Q signal dynamic skew control
  • evaluation of skew, emphasis, and crosstalk effects up to 28 Gbps
  • easy operation using built-in Auto Search function
  • modular design supporting staged infrastructure upgrades to meet customers' evolving needs

Anritsu is exhibiting at ECOC 2009 in Vienna, Austria, in Booth #662, from Sept. 21-23.

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