JDSU intros 2.5/2.7G SONET/SDH jitter/wander test platform
May 10, 2006 Milpitas, CA -- JDSU has introduced its 2.5/2.7G SONET/SDH jitter/wander module for the company's ONT-506 and ONT-512 testers. According to the company, combining existing 2.5/2.7G optical and electrical interfaces with a new 2.5/2.7G jitter/wander feature, the testers now provide physical layer jitter/wander testing from 155 Mbit/sec up to 43 Gbit/sec, helping to address the bandwidth demands of deploying triple play services in metro and long haul networks.
May 10, 2006 Milpitas, CA -- JDSU has introduced its 2.5/2.7G SONET/SDH jitter/wander module for the company's ONT-506 and ONT-512 testers. According to the company, combining existing 2.5/2.7G optical and electrical interfaces with a new 2.5/2.7G jitter/wander feature, the testers now provide physical layer jitter/wander testing from 155 Mbit/sec up to 43 Gbit/sec, helping to address the bandwidth demands of deploying triple play services in metro and long haul networks.
Jitter and wander are disturbances in a high-speed network that affect reliability and service performance. The company says the new module significantly enhances the ONT product line's intrinsic jitter performance for the accurate validation of very low-level jitter generation based on peak-to-peak and root mean square (RMS) jitter requirements. The enhancements reduce the need to re-test marginal cases, resulting in lower costs and faster time-to-market, contends the company.
Technical features for the 2.5/2.7G jitter/wander module include generation and analysis of jitter/wander at 155 Mbit/sec, 622 Mbit/sec, 2.5 Gbit/sec and 2.7 Gbit/sec for SONET OC-3/12/48, SDH STM-1/4/16, and OTN OTU-1 (G.709 FEC). The module is compliant to ITU-T O.172/O.173 and provides the full set of jitter measurement capabilities (jitter generation, automatic jitter tolerance, and automatic jitter transfer) which help during the design, manufacturing, and commissioning of SDH/SONET/OTN systems.
The module's ITU-T O.172 Appendix VII-based calibration procedure provides a guaranteed jitter receiver accuracy with a fixed error of 15-mUI peak-to-peak and 3-mUI RMS. Additional features of the module's jitter/wander capabilities include wander analysis of TIE, MTIE/TDEV (online), frequency offset, and drift rate with graphs and built-in masks.
"Extremely accurate measurement of jitter generation is an increasingly important issue, in part because of the pressure to reduce component size and the cost associated with related design adjustments," explains Bernhard Mueller, general manager for JDSU's optical transport test and measurement group. "With these new features, JDSU further enhances our line of jitter testers that help equipment manufacturers and network operators meet the challenges associated with the design and the deployment of high-bandwidth networks."
