February 13, 2006 San Jose, CA -- JDSU and SyntheSys Research announced a channel agreement for the SyntheSys BERTScope family of products. The companies say the agreement creates a comprehensive source of physical layer test products for optical components, modules and network elements, while enhancing JDSU's position as a provider of test platforms for lab environments and network equipment manufacturers.
According to a press release, the agreement covers Europe, Asia-Pacific (excluding Japan), Canada, and targeted accounts in the U.S., and provides a portfolio of physical layer optical test, measurement, and automated platforms for jitter, BERT, stressed eye sensitivity, SONET/SDH transport, and optical parametrics, aimed at equipment manufacturers.
"Teaming with JDSU combines the success of the BERTScope line with the power of a world class technical sales and service team for global equipment manufacturers, optical component companies, and manufacturing organizations," comments Dr. Lutz Henckels, CEO of SyntheSys Research.
The companies say the JDSU/SyntheSys Research portfolio includes the JDSU OPTX10 line of reference generators, which have been tested for seamless interoperability with the SyntheSys BERTScope S and BERTScope CR HS clock recovery instrument. The combination of instruments creates a test platform for optical receiver testing up to 10.71 Gbit/sec and enables design engineers to easily measure IEEE 802.3ae stressed receiver sensitivity, jitter, and test for compliance with greater insight into device characterization at BER of 10-12, according to the companies. Also included in the portfolio is the JDSU ONT-506/512, which offers SONET/SDH, OTN, Ethernet BERT, and high-accuracy jitter testing at the physical layer; and the JDSU Multiple Application Platform (MAP) for optical signal conditioning, a software programming tool.
"Our companies share a common customer philosophy in developing solutions that anticipate their needs, address specific market opportunities, and maximize legacy investments," remarks John Peeler, executive vice president of JDSU's Test and Measurement group. "By offering this product, the customer can deal with one company for testing at the photonic through the protocol level for jitter testing, for both components and systems."
The combined product portfolio will be on display at next month's OFC/NFOEC 2006 in Anaheim, CA.