SyntheSys Research launches "ultimate" bit error rate test system

March 18, 2002--SyntheSys Research Inc., manufacturer of digital analysis test and measurement equipment, has unveiled the BitAlyzer BA1500--the industry's first multi-function bit error rate-based physical layer test system, claim company representatives.

SyntheSys Research Inc., manufacturer of digital analysis test and measurement equipment, has unveiled the BitAlyzer BA1500--the industry's first multi-function bit error rate-based physical layer test system, claim company representatives.

The system includes Pattern Generation, Bit Error Detection, Eye Pattern Display, Automatic Jitter and Q-factor measurements, and Fast Eye Masks tests all in one unit. The BitAlyzer also features interface flexibility with variable amplitude, offset, logic threshold, and termination voltages for both differential and single-ended I/O. The system supports data rates of 1 Mbit/sec to 1.5 Gbits/sec and includes the company's patented Error Analysis features, which assist in isolating the source of bit errors.

According to the company, its BitAlyzer eliminates the need for moving test equipment or recabling--both previously required for design debug, product certification, and monitoring digital channels. Bit error rate-based testing results in improved test speed and accuracy for eye mask, bit error rate bathtub/contour, and jitter measurements.

The system is a high-rate bit error analysis tool that provides multiple simultaneous perspectives of a digital channel's errors. The company's patented analysis capabilities provide insight in to the nature of errors and are used to examine the underlying source of digital channel problems.

For more information about SyntheSys Research (Menlo Park, CA), visit the company's Web site at www.synthesysresearch.com.

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