Yokogawa Test & Measurement: AQ7420 High-Resolution Reflectometer

With the increasing performance and integration of silicon photonics and optical connectors, even minute reflections or positional shifts can significantly affect overall device performance. Conventional measurement instruments often fail to accurately detect such subtle reflections, making it difficult to identify the root causes of design errors or manufacturing defects. Yokogawa Test & Measurement's AQ7420 Series is a high-resolution reflectometer that measures reflection intensity and position within optical connectors and modules. Thanks to its OLCR technology, the AQ7420 Series addresses these challenges with a spatial resolution of 40 µm and spurious noise suppression down to −100 dB, enabling precise mapping of fine reflections. This supports robust quality control and failure analysis throughout the design and production process. Ideal applications include analyzing photonic components in silicon photonics chips, inspecting the internal structure of optical connectors and modules, and evaluating propagation loss in optical waveguides.

Judge’s comment: “Yokogawa's precision measurement capabilities are a key enabling technology for the generation of optical connectivity serving tomorrow's communications needs.”