JDSU: Multi-Wavelength Meter (mWAVE-A1) and Hi-Resolution OSA (mHROSA-A1) Spectral Measurement Modules

The only product cited by two judges for an Honorable Mention, the MAP mWAVE is the world’s most compact high-resolution multi-wavelength meter for WDM component spectral characterization from sub-10G through 400G. It is a natural replacement for aging multi-wavelength meters as a next-gen solution. Compact and modular, the multi-wavelength meter minimizes test footprint and enables easier integration into an automated test process. It also reduces downtime and optimizes MTBF with a more robust instrument that has no moving parts. The test system covers a wide range of lab and manufacturing test requirements for spectral devices. Its flexible design enables a dual-function capability: high resolution multi-wavelength meter and/or optical spectrum analyzer.