Yokogawa Corporation of America: AQ7420 series High-Resolution Reflectometer

With the increasing performance and integration of silicon photonics and optical connectors, even minute reflections or positional shifts can significantly affect overall device performance. Yokogawa's AQ7420 series can make such measurements without spurious noise, thanks to its innovative OLCR technology. The AQ7420 Series addresses these challenges with a spatial resolution of 40 µm and spurious noise suppression down to −100 dB, enabling precise mapping of fine reflections. This supports quality control and failure analysis throughout the design and production process. Ideal applications include analyzing photonic components in silicon photonics chips, inspecting the internal structure of optical connectors and modules, and evaluating propagation loss in optical waveguides.

Judge’s comment: “Yokogawa's precision measurement capabilities are a key enabling technology for the generation of optical connectivity serving tomorrow's communications needs.”