EXFO upgrades DWDM passive component test system, enhances tunable laser sources
Oct. 11, 2001--EXFO Electro-Optical Engineering Inc. announced a major upgrade to its IQ-12004B DWDM Passive Component Test System. The company also announced a major enhancement to its IQ-2600B and FLS-2600B Tunable Laser Sources for C- and L-Band testing.
EXFO Electro-Optical Engineering Inc. (NASDAQ: EXFO, TSE: EXF) announced a major upgrade to its IQ-12004B DWDM Passive Component Test System.
EXFO improved the wavelength uncertainty of its DWDM Passive Component Test System to ±0.005 nm, which ranks it among industry leaders. EXFO also enhanced the wavelength repeatability to ±0.001 nm, which is particularly useful for measuring polarization dependent loss and component drift during qualification testing.
These improvements in technical specifications render this automated test system an ideal choice for DWDM passive component manufacturers. This is particularly true for manufacturers of next-generation, ultra-dense WDM components in which wavelength accuracy is crucial.
The company also announced a major enhancement to its IQ-2600B and FLS-2600B Tunable Laser Sources for C- and L-Band testing. EXFO improved the wavelength uncertainty of its manufacturing-plant tunable laser sources, both modular and benchtop units, to ±15 pm to enable the characterization of DWDM components with the utmost precision.
Wavelength uncertainty represents one of the most critical parameters in DWDM passive component testing. Manufacturers, who need to ensure that central wavelength and channel bandwidth specifications meet industry requirements during qualification, will feel confident with the accuracy of these tunable laser sources.
EXFO also increased the wavelength repeatability of its tunable lasers to ±5 pm to ensure accurate measurements time after time for optical component manufacturers.
The IQ-2600B Tunable Laser Source is offered as a module in the IQ-12004B DWDM Passive Component Test System for C- and L-Band testing of insertion loss, polarization dependent loss and optical return loss.
In addition, the company launched its FLS-2300B Amplified Spontaneous Emission (ASE) Broadband Source. EXFO's second-generation broadband source displays an excellent 0.01-dB spectral power stability. This stability makes the FLS-2300B ASE Broadband Source ideal for characterization of DWDM passive components, such as thin-film filters, arrayed waveguides, and fiber Bragg gratings, and even for network characterization.
The new broadband source also covers an extended spectral wavelength range, including the C- and L-Bands. Recent advances in optical-amplifier technology have opened up the L-Band for commercial transmission equipment, effectively doubling the potential capacity of DWDM systems. However, associated with this extended wavelength range has come the need for the same rigorous testing of L-Band components as that already in place for C-Band components. The FLS-2300B is particularly well adapted for testing in both bands.
Combined with EXFO's manufacturing-plant (IQ-5250) or field-ready (FTB-5240) Optical Spectrum Analyzer, it achieves a fast testing time and a high dynamic range over the larger spectral window now used in advanced optical networking. Bundled with EXFO's PCA-8000 Passive Component Analyzer, it represents an accurate DWDM passive component test system.
EXFO is a designer and manufacturer of fiber-optic test, measurement and automation solutions for the telecommunications industry. For more information, visit www.exfo.com.