EXFO introduces PDL test instruments, launches comb controller for testing EDFAs
EXFO Electro-Optical Engineering Inc. (NASDAQ: EXFO, TSE: EXF) announced the release of its latest generation of instruments for measuring polarization-dependent loss (PDL): IQ-5100B Polarization Scrambler and IQ-3400B PDL Meter. Both test instruments were recently on display at OFC 2001 in Anaheim, CA.
PDL is the difference between the maximum and minimum values of loss due to the variation in polarization states of light passing through a device. Optical components like couplers, fixed attenuators and isolators have to comply with stringent PDL specifications that are checked on the production floor.
"PDL is a critical parameter in today's networks," said Mario Larose, Vice-President of Marketing at EXFO. "The IQ-5100B Polarization Scrambler and IQ-3400B PDL Meter can be combined to produce a reliable, easy-to-use PDL test solution for optical component manufacturers." The IQ-5100B offers a low activation loss, nearly 20 times lower than that of the first-generation polarization controller. Testing on the production line requires a fast, highly reliable instrument with low activation loss, coupled with a wide wavelength range. The IQ-3400B PDL Meter uses a scanning method to measure PDL, polarization-dependent coupling ratio (PDCR), optical return loss (ORL) and insertion loss.
EXFO also announced the recent launch of the IQ-12007A Multiwavelength Comb Controller at OFC 2001 in Anaheim, California.
The Multiwavelength Comb Controller is EXFO's first integrated system to enable full, automated control of multiple laser sources for erbium-doped fiber amplifier (EDFA) testing applications. An EDFA is an optical amplifier based on a fiber doped with a small amount of the rare-earth element erbium. When this fiber is illuminated with an appropriate laser source (i.e., pump laser), it serves to boost or amplify optical signals.
The Multiwavelength Comb Controller supports up to 160 channels of distributed feedback (DFB) laser sources. This system, which is designed for optical component manufacturers, was also on display during OFC 2001 from March 19-21 at the Anaheim Convention Center.
The Multiwavelength Comb Controller is a modular, open-architecture system. Components can be used together or separately, depending on the task. It supports most programming environments for testing and measurement applications.
About EXFO:
EXFO is a designer and manufacturer of fiber-optic test, measurement and monitoring instruments for the telecommunications industry. For more information, visit www.exfo.com.