dBm Optics debuts photodiode test system

March 18, 2004, Boulder, CO -- dBm Optics, Inc. announced its new model 280 Photodiode Test System. This system allows suppliers of PIN and APD photodiodes to characterize the parametric performance of their components in R&D, quality assurance, and production.

Mar 19th, 2004

March 18, 2004, Boulder, CO -- dBm Optics, Inc. announced its new model 280 Photodiode Test System. This system allows suppliers of PIN and APD photodiodes to characterize the parametric performance of their components in R&D, quality assurance, and production.

The system is very accurate, fast and inexpensive, according to the company. It tests photodiode responsivity across wavelength and has unparalleled speed and accuracy in polarization dependent responsivity (PDR) measurement. The 280 System supports both the traditional all-states PDR and the four-state and six-state PDR measurement methods.

The 280 system implements "Real-Time Referencing," a technique developed for dBm Optics' Component Spectrum Analyzer and applied here to the photodiode characterization. Real-Time Referencing eliminates many of the errors that have plagued responsivity measurement (especially polarization-dependent responsivity).

The 280 can test one photodiode or hundreds of photodiodes in one system. Measurement noise is very low (below 200 fA). This noise level allows for very accurate dark current characterization, which is essential in making accurate measurements of this kind. Settable 0-10 V bias voltage from generation is built-in, thus eliminating the need for separate sourcing and measurement.

A complete characterization of a photodiode (including responsivity and polarization dependency over wavelength) is accomplished in less than 8 sec, making this measurement the fastest of its kind.

The 280 Photodiode Test System is available immediately.

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