Etec, Inc. announced it delivered a MEMS Motion Analyzer (MMA) test system to another telecomm manufacturer. The MEMS Motion Analyzer is a turnkey system for characterizing the complex motions of MEMS/MOEMS. The system can measure motions in 6 degrees-of-freedom, with nanometer resolution, at frequencies from 1 Hz to 10 MHz.
The MEMS Motion Analyzer combines video microscopy, stroboscopic illumination, and proprietary algorithms to analyze the motions of individual microstructures, or arrays of microstructures, simultaneously. Engineers and researchers can test and characterize the complex motions of virtually any MEMS/MOEMS device, including variable optical attenuators (VOAs), optical switches, optical cross connects (OXCs), and 2-D and 3-D micro-mirror arrays. The system can readily analyze performance characteristics such as resonant behavior, transient response, settling time, switching time, and complex motion profiles; all with simple point-and-click operation.
Established in 1986 as an electronics testing business, Etec has been providing instrumentation and equipment for volume production of MEMS devices since 1994. For more information, visit www.etec-inc.com.