Yenista Optics adds variable backreflector module to OSICS test platform

Yenista Optics has added a new module to its multi-channel OSICS test platform. The “OSICS BKR” variable backreflector module is designed to provide a controllable back reflection of up to 55 dB over a wavelength range of 1250 nm to 1650 nm.
Aug. 12, 2011
2 min read

Yenista Optics has added a new module to its multi-channel OSICS test platform. The “OSICS BKR” variable backreflector module is designed to provide a controllable back reflection of up to 55 dB over a wavelength range of 1250 nm to 1650 nm.

The new module enables equipment designers to use the OSICS platform to evaluate the effects of back reflection (return loss) on their system designs. Such reflections naturally occur in fiber-optic networks, due to such factors as Rayleigh scattering, the mismatch of refractive indices within optical components, and poor or open connectors.

The “OSICS BKR” can be integrated with other test instruments such as light sources, optical switches, and variable attenuators as part of the multi-channel OSICS platform, Yenista says. The modules are designed to be controlled either manually or via the GPIB and RS-232 interfaces.

According to David Heard, sales and marketing manager at Yenista, “The OSICS platform is widely used throughout the fiber-optics industry. Adding additional modules provides our customers with a cost-effective upgrade without changing the platform and control software with which they are familiar. The module is particularly useful to stress transceivers for return-loss sensitivity measurements and for PON system testing where open connectors are an issue.”

For more information on test equipment and suppliers, visit the Lightwave Buyers Guide.

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