Anritsu enhances CMA5000 with advanced OTN testÂ
JULY 18, 2008 -- Anritsu Company (search for Anritsu) has introduced an Optical Transport Network (OTN) tester that further extends the analysis capability of its CMA5000 Universal Transport Analysis (UTA) module. According to the company, the new tester brings features for testing OTU-1 and OTU-2 networks to the CMA5000 UTA module, providing technicians and engineers with a powerful set of test functions needed for installing, commissioning, and troubleshooting today's OTN networks.
In addition to the legacy G.709 rates (10,709 Gbits/sec and 2,666 Gbits/sec), the UTA module now supports the new 11,049 Gbits/sec and 11,096 Gbits/sec rates. Both formats are identical to standard OTU-2 frame but with over clocking in order to adapt the payload of the OTN frame to the 10-Gigabit Ethernet (10-GbE) LAN-PHY line rate.
One of the unique features of the CMA5000 OTN application is the special error insertion, which is compliant to O.182 for evaluation of the Forward Error Correction (FEC) performance of OTN networks, say company representatives. With the new option, the CMA5000 is the first field instrument that meets the specification and allows for a comparison between the results obtained and the theoretical FEC curve defined in G.709.
The new tester also adds to the UTA module's existing 10-GbE and SONET/SDH capabilities. To ensure proper and efficient deployment of services, the UTA 10-GbE application measures critical parameters during network installation, including throughput, latency, burstability ,and frame loss (as detailed in RFC 2544). Anritsu says the UTA SONET/SDH application provides efficient, reliable testing of a multitude of parameters, including alarm and error analysis, APS with 125-micron resolution, round trip delay measurement with 100-ns resolution, network availability, and performance evaluation.
The CMA5000 offers all the test applications required for comprehensive physical layer characterization, including OTDR, chromatic dispersion, polarization mode dispersion, loss test set, and optical return loss.
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