Digital Lightwave offers tunable laser on 40G portable test instrument

APRIL 1, 2008 -- Digital Lightwave Inc. says that the NIC 40/43G Testing Module now can be ordered with a tunable laser for C-Band or L-Band applications, with NRZ, duobinary, and DPSK line codes available.

APRIL 1, 2008 -- Digital Lightwave Inc. (search for Digital Lightwave) says that the NIC 40/43G Testing Module now can be ordered with a tunable laser for C-Band or L-Band applications, with NRZ, duobinary, and DPSK line codes available. The NIC is the first in the industry to support this feature in a portable instrument, the company asserts.

A tunable laser is a feature that test instruments must have to simulate "alien wavelength" applications in OADM and ROADM testing, Digital Lightwave says. It is also useful for DWDM filter verification and test, receiver sensitivity, and dispersion sensitivity testing over a wavelength span. With the widespread deployment of 40G networks, the need for these types of testing is increasing.

The NIC Platform offers SONET/SDH, OTN, and Ethernet testing, traditionally up to 10 Gbits/sec. A new module was announced in 2007 to provide 40- and 43-Gbits/sec. The new module is available in the NIC 40G test set; it can be configured in the NIC Plus (portable) or NIC EP (rackmount) to provide PDH/T-Carrier and SONET/SDH testing from 1.5 Mbits/sec to 43 Gbits/sec plus NextGen (VCAT, LCAS, GFP), Gigabit Ethernet, and 10-Gigabit Ethernet in one unit. Digital Lightwave's 40/43-Gbit/sec offerings are designed to be applicable to research and development, manufacturing, and field deployment applications.

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