Anritsu's software evaluates optical modulators and transponders
MARCH 27, 2009 -- Anritsu supports the latest 100G/40G band optical phase-modulation schemes with precode/decode software.
MARCH 27, 2009 -- Anritsu Co. (search Lightwave for Anritsu) extends the 100-Gbps test capabilities of its MP1800A signal quality analyzer with the introduction of precode/decode software that has been developed to support the latest optical phase-modulation schemes, including DP-QPSK, DQPSK, DPSK, and ODB, used in next-generation networks (NGNs). The new software package complements the two-channel mux/demux configuration of the MP1800A to provide device manufacturers with a test instrument for evaluating high-speed optical modulators and transponders.
Anritsu says the precode and decode functions of the MX180000A-001/002 option help reduce 100G and 40G core-network R&D costs as well as time-to-market by supporting fully automatic generation of modulation signals needed to evaluate 100G DP-QPSK, and 40G DQPSK, DPSK, and ODB optical modulation technologies. The precode function automatically generates 100G DP-QPSK, and 40G DQPSK, DPSK, and ODB modulation signals for evaluating optical modulators. The decode function is for evaluating the logic of precoders in optical modules.
All electrical, modulation, and demodulation signals required for evaluating DP-QPSK, DQPSK, DPSK, and ODB devices are generated automatically by the tester. The test solution eliminates modulation pattern editing and programming and reduces the time necessary for evaluating modulation errors and error rates.
Hardware-based generation of modulation signals produces pure PRBS31 signals without pattern length restrictions, so the MP1800A can conduct evaluations using high-load pseudo-random patterns that closely emulate live traffic. Users can vary the skew between I and Q signals with high resolution over a wide range (±64 UI, 2 mUI steps) to confirm the input skew margin of DQPSK modulators with confidence.
The MP1800A has a high-performance receiver with a wide phase margin of >288 degrees and typical input sensitivity of 50 MVp-p.
Providing a pulse pattern generator (PPG) and error detector (ED) in a single chassis, the instrument allows multichannel support for parallel testing. It is suited for research and development of 100/40G optical modulators, high-speed logic ICs, digital systems, and PON devices. It supports optical devices from 0.1 to 100 Gbits, the widest range available in its category.
Delivery is 6 to 8 weeks ARO.
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