Anritsu intros Micro-OTDR

NOVEMBER 14, 2007 -- Anritsu Co. has introduced the Network Master MT9090A Fault Locator Series, a "micro" OTDR for installation and maintenance of FTTx and short-range optical networks.

NOVEMBER 14, 2007 -- Anritsu Co. (search for Anritsu) has introduced the Network Master MT9090A Fault Locator Series, a "micro" OTDR for installation and maintenance of FTTx and short-range optical networks.

The MT9090A series combines the size of traditional handheld OTDRs and fault locators with the resolution and overall performance of mini-OTDRs to create the first truly compact, easy-to-use optical test instrument that addresses the specific test requirements of short fiber premises applications, such as FTTx drop cables, intra-building riser cables, and cell towers, according to the company.

When equipped with the MU909011A Fault Locator Module, the new MT9090A is designed to provide all of the features and performance required for installation and maintenance of short fibers in a compact, modular test set. The MT9090A can provide data sampling of 5 cm and dead zones of < 1 m, Anritsu adds.

It offers high resolution to see closely spaced splices and connectors, while providing "unmatched" simplicity. An integrated testing sequence, as well as no cumbersome set-up, ensures every technician will acquire consistent and accurate results, Anritsu says. This includes easy GO/NO GO testing. A simple testing sequence requires only one key press to initiate, and fixed parameters simplify operation and ensure proper set-up, Anritsu says. The MT9090A series also features an integrated 10-m launch fiber to ensure accurate initial connector measurement without external devices.

The MT9090A series features a high-resolution widescreen indoor/outdoor display, integrated or USB data storage, and full trace viewing capabilities. Integrated visual fault locator (red light) and power meter options are also available.

The MT9090A Fault Locator Series is available for immediate delivery.

Visit Anritsu

For more test & measurement news and resources, visit the Test & Measurement Resource Center

More in Test