SEPTEMBER 18, 2007 — Keithley Instruments, Inc., added the Models 2635 and 2636 to its series 2600 SourceMeter instruments for parametric analysis at 1-fa (10-15-amp) resolutions. Model 2635 is a single-channel unit; 2636 is a dual-channel unit.
The systems suit semiconductor, optoelectronic, and nanotechnology device- and wafer-level test. Instrument-based, multi-channel architectures are said to reduce tests costs by up to 50%. Keithley also incorporates its test script processor (TSP) and TSP-Link intercommunications bus. Testing is said to benefit from shorter test times, increased throughput, and simplified system development.
The Models 2635 and 2636 provide reportedly cost-effective DC and pulse testing from femtoamps and microvolts up to 200 V/1.5 A. They operate with or without a PC, and each includes a PC-type microprocessor to facilitate programming and test execution. Scripts include sourcing, measuring, test-sequence flow control, and conditional program branching.
Keithley introduced the systems as cost-effective test instruments for low- and medium-pin-count devices, multiple devices, and materials samples. They operate a source-measure unit (SMU), digital multi-meter (DMM), bias source, low-frequency pulse generator, and arbitrary waveform generator in each unit, and can integrate with automated lines.
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