Agilent Technologies enhances serial BER test series

7 May 2003 Palo Alto, CA Lightwave -- Agilent Technologies Inc. has introduced two new members to the N4900 serial bit error ratio (BER) test series that provide built-in true differential inputs/outputs, clock data recovery (CDR), and enhanced jitter, analysis and measurement capabilities .

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7 May 2003 Palo Alto, CA Lightwave -- Agilent Technologies Inc. has introduced two new members to the N4900 serial bit error ratio (BER) test series that set a new standard in performance and capabilities. According to the company, the instruments are the industry's first to provide built-in true differential inputs/outputs, clock data recovery (CDR), enhanced jitter, analysis and measurement capabilities to enable R&D, design verification, and manufacturing engineers to perform full parametric measurements across a wide range of technologies and applications.

The two new products cover frequency ranges of 150 Mbits/sec to 13.5 Gbits/sec (Agilent N4901A) or 150 Mbits/sec to 7 Gbits/sec (Agilent N4902A), providing unmatched signal integrity and analysis capabilities, say Agilent representatives. The instruments' new capabilities and their ability to address a range of interfaces in the semiconductor and communication industry will help customers protect their investments in test and measurement equipment.

"What customers have been asking for is what I call long-term security of capital investments and fast ROI [Return on investment]," explains Michael Droemmer, BERT marketing manager of Agilent's Digital Verification Solutions Division. "The customers can no longer afford to buy new test equipment for each new device under test. One box now has to serve all the test needs and requirements that you have right now and in the future."

The instruments of the N4900 serial BER test series can be used for design verification and characterization of line cards, modules, sub-assemblies, and semiconductor chips as well as for general-purpose applications in R&D and manufacturing. The new instruments perform bit error ratio tests and analyze signals through eye diagrams and jitter measurements. With their intuitive and easy-to-use user interface based on the Agilent Infiniium platform, the instruments of the serial BER test series are ideal for addressing critical test needs quickly, accurately, and efficiently.

Agilent's serial BER test series is priced as follows: The Agilent N4901A 13.5 Gbit/sec starts at $165,000; the N4902A 7 Gbit/sec is $128,000; and the N4906A 3.6 Gbit/sec is $89,000. The N4901A and N4902A instruments are expected to ship in August 2003, while the N4906A is expected to ship in June 2003.



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The instruments of the N4900 serial BER test series can be used for design verification and characterization of line cards, modules, sub-assemblies, and semiconductor chips.
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