Tektronix offers 32-Gbps pattern generators, multi-channel bit error rate testers

Tektronix, Inc. has unveiled new instruments for 100-Gbps test and measurement applications. The new products include the PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors, designed for optical and serial datacom testing at signal rates up to 32 Gbps. The units offer multi-channel pattern generation with channel-specific data programming to perform margin testing for high-speed applications such as 100 Gigabit Ethernet that require up to four channels, as well as coherent-enabled 100-Gbps designs.

Tektronix, Inc. has unveiled new instruments for 100-Gbps test and measurement applications. The new products include the PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors, designed for optical and serial datacom testing at signal rates up to 32 Gbps. The bit error rate test units offer multi-channel pattern generation with channel-specific data programming to perform margin testing for high-speed applications such as 100 Gigabit Ethernet that require up to four channels, as well as 100-Gbps designs that use coherent detection.

For testing coherent optical modulation formats, such as DP-QPSK, the PPG3000 Series, with its four phase-aligned channels, can be used with the Tektronix OM4000 Series Coherent Lightwave Signal Analyzer for real-time optimization and validation of coherent modulation formats.

For bit error rate testing, the PED3000 Series can be combined with the PPG3000 to provide up to 32-Gbps BER analysis with multi-channel support, which will enable rapid identification of crosstalk issues in multi-lane designs, Tektronix says. For example, designers can simulate a 4x28G test bench to stress-test their IEEE 802.3ba receivers' designs. The combination of 32-Gbps data rate output and adjustable jitter insertion means technology developers can offer products with industry best margins while improving yields and performance, Tektronix asserts.

"The addition of the PPG3000 and PED3000 Series' to our BERT portfolio enables us to provide customers with choices for critical 100G standards testing," said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. "For in-depth analysis requiring exacting signal integrity we continue to offer our award-winning BERTScope family. The new PPG3000 and PED3000 add the ability to conduct BERT tests that require multi-channel aligned data pattern generation up to 32-Gbps."

The PPG3000 Series includes six models; depending on the model, users can have support for 30 Gbps or 32 Gbps and one, two, or four channels. Features include synchronized and phase adjustable outputs and PRBS or user-defined pattern generation. In particular, the instruments provide the flexibility needed to troubleshoot a wide range of design issues, including crosstalk, Tektronix says.

Meanwhile, the PED3000 Series error detectors come in either one-channel or two-channel models. Tektronix says the instruments combine excellent sensitivity (< 20 mV measured at 30 Gbps) with what the company asserts is the industry's widest data range -- 32 Mbps to 32 Gbps. Error checking functions include PRBS or user-defined patterns, DC-coupled differential data inputs, single-ended clock input, and auto align to input pattern.

The PPG3000 Series Pattern Generators and PED3000 Series Error Detectors will be available in late December 2012. Pricing starts at $85,000 US MSRP.

For more information on lab test equipment and suppliers, visit the Lightwave Buyer’s Guide.

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