SEPTEMBER 17, 2008 -- Luna Technologies (search for Luna Technologies), a division of Luna Innovations Inc., will demonstrate an economical, ultra-high resolution reflectometer, the PR 4400 at the 2009 European Conference on Optical Communication (ECOC), confirm company representatives.
This portable, user-friendly instrument measures reflections as a function of distance and return loss (RL) in a fiber-optic system. The PR 4400 is a test and measurement device for designers and manufacturers of fiber-optic components, modules, cables, and assemblies. It provides the end-user a view of every "event" in a fiber-optic system, allowing faster design cycles and the production of higher quality products.
In a single scan, the PR 4400 gives the user exceptional inspection and diagnostic capabilities with the ability to locate and troubleshoot connectors, fiber breaks and macrobends and accurately measure insertion loss and RL in seconds, claims the company. The PR 4400 features resolution as low as 40 microns and the ability to view an entire assembly immediately from the front panel connector up to 2 kilometers in one scan with zero dead zone.
The PR 4400 joins Luna's reflectometer family of products, such as the Optical Backscatter Reflectometer (OBR 4400), in offering manufacturers an accurate, fast, and reliable measurement tool to reduce the time and cost of testing. According to the company, this results in higher product yields and increased manufacturing throughputs of high-port count components and systems, e.g. FTTx/PON components, ribbon cables, and DWDM/ROADM systems. Luna's PR 4400 quickly and accurately identifies fiber faults and events during design verification, failure analysis, and manufacturing quality certification. The instrument also measures fiber skew with 1 p/sec resolution in ribbon cables and is an ideal tool to reduce development resources.
"With the PR 4400, Luna Technologies is committed to helping fiber-optic manufacturers meet the demands of their customers for higher volumes and greater quality," says David Chan, director of product marketing. "The device provides fast, repeatable, high accuracy measurements for clear pass/fail analysis and is easy to set up and use straight out of the box. The expansion of our reflectometer product line with an accurate and effective measurement tool at an economical price reaffirms Luna's commitment to providing tools that meet our customers' needs."
The PR 4400 is available immediately with a 6-8 week lead time and includes a laptop computer and software for either a maximum of 2-km length with 3-mm resolution or a maximum of 70-meter length with 40-micron resolution. Available options include extended 12-dB loss dynamic range, a custom software development kit, and desktop analysis software. For a limited time, desktop analysis software is offered at no additional cost.
Luna will be demonstrating its reflectometer and analyzer product platforms in Booth #209 at ECOC, September 22-24, 2008.
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