Digital Lightwave adds 40G/100G optical test support to NIC platform

Optical test equipment developer Digital Lightwave, Inc. says it has expanded the capabilities of its NIC platform to include support of 40-Gbps and 100-Gbps applications. The NIC test platform can now be used for both lab and field validation and acceptance testing of 40G and 100G technology.

Oct 17th, 2012

Optical test equipment developer Digital Lightwave, Inc. says it has expanded the capabilities of its NIC platform to include support of 40-Gbps and 100-Gbps applications. The NIC test platform can now be used for both lab and field validation and acceptance testing of 40G and 100G technology.

The NIC test platform now supports rates from 100 Gbps to 1.5 Mbps. It is available in both portable and rackmount form factors. Using the new capabilities, technicians can employ the NIC to verify 100 Gigabit Etherent, 40 Gigabit Ethernet, OTU4, OTU3, OC-768/STM-256, and other protocols and data rates. It is designed to support simultaneous multi-port multi-rate testing, simultaneous multi-user local and remote operation, advanced automation capabilities, and uniform test setup and workflow across all interfaces and technologies, Digital Lightwave says.

“With the NIC, lab and field personnel can add 40/100G capabilities to their existing test sets, and can share resources more efficiently, achieve higher collaboration within their organizations, and minimize test error,” said Al Zwan, president and CEO of Digital Lightwave. “We enable our customers to accelerate time to market for 40/100G while reducing rollout costs, so that they can achieve the expected goals faster.”

For more information on test equipment and suppliers, visit the Lightwave Buyer’s Guide.

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